WANG Kai-ge, WANG Lei, WANG Beng-ye, NIU Han-ben. X-ray Source with Micro-beam Produced with Slow Highly Charged Ions[J]. Journal of Applied Optics, 2004, 25(1): 5-8.
Citation:
WANG Kai-ge, WANG Lei, WANG Beng-ye, NIU Han-ben. X-ray Source with Micro-beam Produced with Slow Highly Charged Ions[J]. Journal of Applied Optics, 2004, 25(1): 5-8.
WANG Kai-ge, WANG Lei, WANG Beng-ye, NIU Han-ben. X-ray Source with Micro-beam Produced with Slow Highly Charged Ions[J]. Journal of Applied Optics, 2004, 25(1): 5-8.
Citation:
WANG Kai-ge, WANG Lei, WANG Beng-ye, NIU Han-ben. X-ray Source with Micro-beam Produced with Slow Highly Charged Ions[J]. Journal of Applied Optics, 2004, 25(1): 5-8.
X-ray Source with Micro-beam Produced with Slow Highly Charged Ions
The electron beam ion trap(EBIT) and the electron ion source(EBIS) are new instruments for the study of X-ray produced by very highly-charged ions when they interact with free electrons. Some of the design and physics features of EBIT/EBIS are described, and the characters of the X-ray produced with them are described too. Micro-focal X-ray can be taken out if focusing the ion beam with the ion-optical system.
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