基于旋转检偏器与RGB成像的透明元件光学参数全场测量方法

    Full-field measurement method for optical parameters of transparent elements based on rotating analyzer and RGB imaging

    • 摘要: 面对透明双折射样品主轴方向、相位延迟量及光程差的全场测量需求,提出一种基于旋转检偏器与普通RGB相机的多参数成像方法。系统利用同一空间像素在36个检偏角度下的光强响应,结合Stokes矢量模型和最小二乘法,实现三类光学参数的逐像素联合反演。针对RGB通道宽光谱响应及交叠问题,引入窄带滤光与分波段无样品标定,以修正角度零位和背景项。标准四分之一波片实验中,主轴方向平均绝对误差为2.065°,不同波长条件下相位延迟量与商用仪器结果的最大相对误差为3.18%;受力亚克力板实验获得了连续的非均匀双折射分布。该系统将同像素多角度偏振调制、窄带分波段标定与三参数逐像素联合反演集成于普通RGB成像系统中,实现了传统单点旋转检偏测量向多波段、多参数全场表征的拓展,并支持对有效测量区域内指定像素位置的主轴方向、相位延迟量和光程差进行定量获取,使全场分布表征与局部特征分析在同一测量平台下实现统一。

       

      Abstract: To address the need for full-field measurement of the principal-axis orientation, phase retardance, and optical path difference of transparent birefringent samples, a multi-parameter imaging method based on a rotating analyzer and a conventional RGB camera was proposed. The system recorded the intensity response of each spatial pixel at 36 analyzer orientations and combined a Stokes-vector model with least-squares fitting to achieve joint pixel-wise retrieval of the three optical parameters. To mitigate the effects of the broad spectral responses and spectral overlap of the RGB channels, narrowband filtering and sample-free calibration for each spectral band were introduced to correct the angular zero offset and background term. Experiments with a standard quarter-wave plate yielded a mean absolute error of 2.065° for the principal-axis orientation, while the maximum relative error in phase retardance, compared with measurements from a commercial instrument at different wavelengths, was 3.18%. Experiments on a stressed acrylic plate further revealed continuous, spatially nonuniform birefringence distributions. By integrating same-pixel multi-angle polarization modulation, band-specific narrowband calibration, and joint pixel-wise retrieval of three optical parameters into a conventional RGB imaging system, the proposed approach extends traditional single-point rotating-analyzer measurement to multi-wavelength, multi-parameter full-field characterization. It also enabled quantitative extraction of the principal-axis orientation, phase retardance, and optical path difference at selected pixel locations within the effective measurement region, thereby unifying full-field distribution characterization and local feature analysis on a single measurement platform.

       

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