吴烈权, 周志峰, 朱志玲, 张维, 王勇. 基于改进YOLO-V4的贴片二极管表面缺陷检测[J]. 应用光学, 2023, 44(3): 621-627. DOI: 10.5768/JAO202344.0303007
引用本文: 吴烈权, 周志峰, 朱志玲, 张维, 王勇. 基于改进YOLO-V4的贴片二极管表面缺陷检测[J]. 应用光学, 2023, 44(3): 621-627. DOI: 10.5768/JAO202344.0303007
WU Liequan, ZHOU Zhifeng, ZHU Zhiling, ZHANG Wei, WANG Yong. Surface defect detection of patch diode based on improved YOLO-V4[J]. Journal of Applied Optics, 2023, 44(3): 621-627. DOI: 10.5768/JAO202344.0303007
Citation: WU Liequan, ZHOU Zhifeng, ZHU Zhiling, ZHANG Wei, WANG Yong. Surface defect detection of patch diode based on improved YOLO-V4[J]. Journal of Applied Optics, 2023, 44(3): 621-627. DOI: 10.5768/JAO202344.0303007

基于改进YOLO-V4的贴片二极管表面缺陷检测

Surface defect detection of patch diode based on improved YOLO-V4

  • 摘要: 针对传统目测法检测贴片二极管表面缺陷效率低下和基于手工特征的目标检测算法模型较浅,以及语义性不高等问题,提出了改进YOLO-V4的贴片二极管表面缺陷检测方法。首先考虑到随着网络加深使梯度消失,以及减少网络中的特征冗余和参数量的情况,CSP1模块采用DenseNet替换原网络中的ResNet;其次,为了实现特征信息的跨维度交互,让网络更加关注重要信息,在CSP1模块后引入了三分支注意力机制模块,同时使用FPN+PANet对特征进行融合;并且用CSP2替换CBL×5模块,降低了网络的运算量,提高了算法检测速度;最后优化了Focal Loss函数,对正负样本添加权重,以解决正负样本不平衡的问题。本文算法相较于YOLO-V4的检测精度(precision,P)、召回率(recall,R)和多分类平均精度(mean average precision,mAP),分别高出2.98%,2.65%,2.92%,表明改进YOLO-V4可以有效检测贴片二极管表面缺陷问题。

     

    Abstract: Aiming at low efficiency of traditional visual detection method and shallow model as well as low semantic character of target detection algorithm based on manual features, an surface defect detection method of patch diode based on improved YOLO-V4 was proposed. Firstly, DenseNet was used in CSP1 module to replace ResNet in original network, considering that gradient disappeared with network deepening and feature redundancy as well as parameters were reduced. Then, to realize cross-dimensional interaction of feature information and make the network pay more attention to important information, the three-branch attention mechanism module was introduced after CSP1 module, and features were fused with FPN+PANet. CBL×5 module was replaced by CSP2, which reduced computation of network and improved detection speed of algorithm. Finally, the Focal Loss function was optimized and weight was added to positive and negative samples to solve the imbalance problems. The detection precision (P), recall ratio (R) and mean average precision (mAP) of the algorithm are 2.98%, 2.65% and 2.92% higher than that of YOLO-V4, respectively, which shows that the improved YOLO-V4 can effectively detect the surface defects of patch diode.

     

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