玻璃影响下的线结构光测量系统模型

Model of line structured light measurement system under influence of glass

  • 摘要: 为了消除玻璃厚度对线结构光三维测量系统的影响,构建了一个新的三维测量模型。基于斯涅尔定律建立了相机折射模型,精确计算出玻璃影响下光线的传播路径,提出了一种新的标定方法,实验得到相机的重投影误差为0.23像素;同时提出了一个新的平面校正方法,通过激光平面、折射面和玻璃厚度之间的关系,可快速完成所有激光平面校正,点云拟合平面的均方根误差可达0.32 mm,绝对距离误差可达0.26 mm。实验结果表明,所提方法具有良好的测量精度,在工业领域具有一定的实用性。

     

    Abstract: In order to eliminate the influence of glass thickness on the line structured light 3D measurement system, a new 3D measurement model was constructed. A camera refraction model was established based on Snell's law to accurately calculate the propagation path of light under the influence of glass. A new calibration method was proposed, and the experimental results showed that the camera's reprojection error was 0.23 pixel. Meanwhile, a new plane correction method was proposed, which could quickly complete all laser plane corrections through the relationship between the laser plane, refractive surface, and glass thickness. The root mean square error of the point cloud fitting plane could reach 0.32 mm, and the absolute distance error could reach 0.26 mm. The experimental results show that the proposed method has good measurement accuracy and certain practicality in the industrial field.

     

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