基于单一光栅分光的光学结构对称型成像光谱仪

Optical structure symmetric imaging spectrometer based on single grating spectroscopy

  • 摘要: 针对成像光谱仪结构复杂、谱线弯曲难以校正的问题,设计并研制了一款基于单一透射光栅分光的高分辨率成像光谱仪。建立了单一透射光栅分光模型,计算确定了分光系统的设计参数,其中,分光系统中准直部分和聚焦成像部分采用完全相同的光学结构,有利于像差校正,也能降低系统成本。设计过程中,以光谱分辨率为主要目标,从聚焦系统到整体分光系统进行逐步优化,最终设计了一套狭缝宽度为11.42 μm,工作波段为450 nm~650 nm,光谱分辨率为2 nm,F数为2.5,谱线弯曲最大值为19 μm,色畸变最大值为0.35 μm的分光系统。根据设计结果完成了该成像光谱仪的制造和装配,并进一步对其进行推扫实验测试验证。实验结果表明:该系统的光谱分辨率不低于2 nm,达到了设计要求,证明该光谱仪成像效果良好。

     

    Abstract: Aiming at the complex structure of imaging spectrometer and the difficulty of correcting spectral line bending, a high-resolution imaging spectrometer based on a single transmission grating was designed and developed. Firstly, the optical splitting model of a single transmission grating was established, and the design parameters of the optical splitting system were calculated and determined. Among them, the collimation part and the focusing imaging part of the optical splitting system adopted the symmetry optical structure, which was conducive to the correction of aberrations and reduce the cost of the system. In the design process, the spectral resolution was taken as the main goal, and gradually optimized from the focusing system to the whole spectral splitting system. Finally, a set of optical splitting system with slit width of 11.42 μm, working band of 450 nm~650 nm, spectral resolution of 2 nm, F-number of 2.5, the maximum spectral line bending of 19 μm, and the maximum color distortion of 0.35 μm was designed. According to the design results, the fabrication and assembly of the imaging spectrometer were completed. The experimental results show that the spectral resolution of the system is not less than 2 nm, which meets the design requirements, and proves that the imaging effect of the spectrometer is good.

     

/

返回文章
返回